The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 02, 2014

Filed:

Sep. 26, 2012
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Kam Ho Ho, Dale City, CA (US);

Tony Hui Xu, Sunnyvale, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01); G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A mechanism is provided for collecting one or more performance metrics. A plurality of source code instructions is provided. The source code instructions include a plurality of macro calls. Each of the plurality of macro calls includes a plurality of predetermined parameters. A plurality of object code instructions corresponding to the plurality of source code instructions is executed. In response to receiving a signal identifying at least one of the plurality of macro calls contained in the source code instructions and identifying a desired level of granularity, performance metrics are collected using the identified macro call in accordance with the desired level of granularity.


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