The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 02, 2014
Filed:
Mar. 08, 2012
Applicant:
Eui-seung Kim, Hwaseong-si, KR;
Inventor:
Eui-Seung Kim, Hwaseong-si, KR;
Assignee:
Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 31/3185 (2006.01);
U.S. Cl.
CPC ...
G01R 31/318547 (2013.01);
Abstract
A semiconductor device includes a test pattern decoding unit and a scan chain unit. The test pattern receives a scan-in pattern from an external test device and generates a test pattern based on the scan-in pattern and a scan-out pattern. The scan-in pattern is decoded based on a seed pattern and an expectation pattern. The scan chain unit performs logical operation based on the test pattern and feedbacks the scan-out pattern to the test pattern decoding unit.
Quick Actions:
Kim, Eui-Seung. (2014). Semiconductor device and test system for testing the same (U.S. Patent No. 8904251). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8904251
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