The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 02, 2014

Filed:

Jul. 10, 2012
Applicants:

Brian S. Park, San Diego, CA (US);

Gregory S. Scott, Santa Clara, CA (US);

Anh T. Hoang, Fremont, CA (US);

Inventors:

Brian S. Park, San Diego, CA (US);

Gregory S. Scott, Santa Clara, CA (US);

Anh T. Hoang, Fremont, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 31/317 (2006.01); G11C 29/12 (2006.01); G01R 31/3181 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31716 (2013.01); G11C 29/12 (2013.01); G01R 31/31816 (2013.01);
Abstract

A self-test loopback apparatus for an interface is disclosed. In one embodiment, a bidirectional interface of an integrated circuit includes a transmitter coupled to an external pin, a first receiver coupled to the external pin, and a second receiver coupled to the external pin. During operation in a test mode, the first receiver may be disabled. The transmitter may transmit test patterns generated by a built-in self-test (BIST) circuit, and compare those test patterns to patterns received by the second receiver. The second receiver may be implemented as a Schmitt trigger (wherein the first receiver may be a standard single-bit comparator). When operating in functional mode, the second receiver may be disabled.


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