The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 02, 2014
Filed:
Jan. 19, 2012
Shimon Ben-yehuda, Haifa, IL;
Eli Bokshtein, Haifa, IL;
Shimon Ben-Yehuda, Haifa, IL;
Eli Bokshtein, Haifa, IL;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A novel and useful stress test generation mechanism that is operative to divide the task of generating test case programs (files) into a first randomization stage and a second randomization stage. The first randomization stage selects the scenario and the second randomization stage generates a test case in accordance with the chosen scenario. In other words, during stage 1, a test scenario (i.e. value-categories) is randomly determined (using the weights assigned to the value-categories within each scenario-dimension). In stage 2, a test is randomly generated for the chosen scenario. Thus, for each scenario-dimension, one or more values are generated randomly for the chosen value-category. Once the values for the value-categories are generated, an output test file for use by the logic verification is generated.