The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 02, 2014

Filed:

Mar. 08, 2012
Applicants:

Torsten Zeppenfeld, Emerald Hills, CA (US);

N. Nikki Mirghafori, Berkeley, CA (US);

Lisa Guerra, Los Altos, CA (US);

Richard Gutierrez, San Jose, CA (US);

Anthony Rajakumar, Fremont, CA (US);

Inventors:

Torsten Zeppenfeld, Emerald Hills, CA (US);

N. Nikki Mirghafori, Berkeley, CA (US);

Lisa Guerra, Los Altos, CA (US);

Richard Gutierrez, San Jose, CA (US);

Anthony Rajakumar, Fremont, CA (US);

Assignee:

Verint Americas Inc., Alpharetta, GA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); H04W 12/12 (2009.01); H04M 15/00 (2006.01); G10L 17/00 (2013.01); G10L 25/48 (2013.01);
U.S. Cl.
CPC ...
H04M 15/47 (2013.01); G10L 17/00 (2013.01); H04W 12/12 (2013.01); G10L 25/48 (2013.01);
Abstract

Systems, methods, and media for generating fused risk scores for determining fraud in call data are provided herein. Some exemplary methods include generating a fused risk score used to determine fraud from call data by generating a fused risk score for a leg of call data, via a fuser module of an analysis system, the fused risk score being generated by fusing together two or more uniquely calculated fraud risk scores, each of the uniquely calculated fraud risk scores being generated by a sub-module of the analysis system; and storing the fused risk score in a storage device that is communicatively couplable with the fuser module.


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