The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 02, 2014

Filed:

Aug. 22, 2012
Applicants:

Michael A. Bodkin, Orlando, FL (US);

Gregory A. Harrison, Oviedo, FL (US);

Sreerupa Das, Oviedo, FL (US);

Richard M. Hall, Orlando, FL (US);

Eric W. Worden, Orlando, FL (US);

Inventors:

Michael A. Bodkin, Orlando, FL (US);

Gregory A. Harrison, Oviedo, FL (US);

Sreerupa Das, Oviedo, FL (US);

Richard M. Hall, Orlando, FL (US);

Eric W. Worden, Orlando, FL (US);

Assignee:

Lockheed Martin Corporation, Bethesda, MD (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

Estimating a remaining useful life (RUL) of an apparatus is disclosed. A computer device may obtain a priori RUL data of an apparatus. The a priori RUL data identifies a priori RULs values of the apparatus as a function of time. Buckets are then defined in the a priori RUL data, wherein each of the buckets corresponds to a different set of the a priori RUL values in the a priori RUL data. An operational event indicator may then be obtained for the apparatus that indicates a current operational event of the apparatus. The RUL of an apparatus is estimated by determining probability values throughout a time period. Probability values are then determined based on the operational event indicator where each probability value quantifies a probability that a current RUL value of the first apparatus is within one of the buckets.


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