The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 02, 2014
Filed:
May. 27, 2011
Sateesh K. Addepalli, San Jose, CA (US);
Lillian Lei Dai, Rockville, MD (US);
Ashok K. Moghe, Pleasanton, CA (US);
Flavio Bonomi, Palo Alto, CA (US);
Rodolfo A. Milito, Los Gatos, CA (US);
Vina Ermagan, San Jose, CA (US);
Fabio R. Maino, Palo Alto, CA (US);
Pere Monclus, San Jose, CA (US);
Sateesh K. Addepalli, San Jose, CA (US);
Lillian Lei Dai, Rockville, MD (US);
Ashok K. Moghe, Pleasanton, CA (US);
Flavio Bonomi, Palo Alto, CA (US);
Rodolfo A. Milito, Los Gatos, CA (US);
Vina Ermagan, San Jose, CA (US);
Fabio R. Maino, Palo Alto, CA (US);
Pere Monclus, San Jose, CA (US);
Cisco Technology, Inc., San Jose, CA (US);
Abstract
A method in one example embodiment includes receiving a set of data in real time from a plurality of machine devices associated with at least one vehicle, providing a set of reference data corresponding to a machine device of the plurality of machine devices, comparing the set of data with the set of reference data, and detecting a deviation within the set of data from the set of reference data. The method further includes initiating an operation associated with the deviation. The set of reference data could be a trend of previous data received from the machine device or a common trend based on a previous set of data of the machine device. More specific embodiments include receiving a plurality of data containing the set of data from the plurality of machine devices and identifying a state of the machine device using the set of data.