The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 02, 2014

Filed:

Aug. 23, 2011
Applicants:

Wael El-essawy, Austin, TX (US);

Heather L. Hanson, Austin, TX (US);

Thomas W. Keller, Jr., Austin, TX (US);

Juan C. Rubio, Austin, TX (US);

Inventors:

Wael El-Essawy, Austin, TX (US);

Heather L. Hanson, Austin, TX (US);

Thomas W. Keller, Jr., Austin, TX (US);

Juan C. Rubio, Austin, TX (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 13/00 (2006.01); G01D 21/00 (2006.01);
U.S. Cl.
CPC ...
G01D 21/00 (2013.01);
Abstract

Data center environmental sensing is provided by a measurement system that detects environmental events from inputs received from a plurality of movable sensors. The sensors are moved in response to detection of an event to a region of the data center associated with the event, providing increased spatial resolution of the measurement in the region of the event. Events such as leakage between hot and cold aisles of a data center can be detected by the system, which may use one or more movable devices that can be moved around, between and over equipment, to carry multiple sensors toward the source of the event, providing both diagnostic and detailed environmental information.


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