The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 02, 2014

Filed:

Dec. 12, 2011
Applicants:

Matthew D. Blasczak, Shirley, NY (US);

Alan J. Epshteyn, Miller Place, NY (US);

Mehaboob Kumbalakkuzhiyil, Ronkonkoma, NY (US);

Bruno Vande Vyvre, Westhampton, NY (US);

Michelle X. Wang, Mount Sinai, NY (US);

Inventors:

Matthew D. Blasczak, Shirley, NY (US);

Alan J. Epshteyn, Miller Place, NY (US);

Mehaboob Kumbalakkuzhiyil, Ronkonkoma, NY (US);

Bruno Vande Vyvre, Westhampton, NY (US);

Michelle X. Wang, Mount Sinai, NY (US);

Assignee:

Symbol Technologies, Inc., Holtsville, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/22 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method for processing an image of a document is disclosed. The method includes receiving at least one predetermined document parameter of the document. An image of the document is previewed on a display using a camera. The display provides a visual indication of a defect in the image based on the preview. A processor proposes a procedure to minimize the defect in the image. A user adjusts the camera in response to the proposal. The processor processes the image of the document.


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