The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 02, 2014

Filed:

Dec. 22, 2011
Applicants:

Zhonghao Bao, Rochester, MN (US);

Scott O Stiving, Rochester, MN (US);

Kiaran P Mcgee, Rochester, MN (US);

Inventors:

Zhonghao Bao, Rochester, MN (US);

Scott O Stiving, Rochester, MN (US);

Kiaran P McGee, Rochester, MN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00214 (2013.01); G06K 9/6206 (2013.01);
Abstract

A system and method for assessing the operation of a imaging system, such as magnetic resonance imaging (MRI) system, is disclosed including a that computer is programmed to access an image of a phantom from image data, identify a plurality of seed point in the image of the phantom using a shape recognition algorithm, and rank combinations of the seed points using a pattern recognition algorithm using a priori information about the predefined pattern. The computer is programmed to rank the combinations of the seed points to generate an indication of an imaging quality characteristic of the imaging system.


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