The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 02, 2014
Filed:
Jan. 27, 2010
Applicants:
Qinglin Liu, Oslo, NO;
Kambiz Iranpour, Oslo, NO;
Inventors:
Qinglin Liu, Oslo, NO;
Kambiz Iranpour, Oslo, NO;
Assignee:
WesternGeco L.L.C., Houston, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 1/30 (2006.01);
U.S. Cl.
CPC ...
G01V 1/30 (2013.01); G01V 1/307 (2013.01); G01V 2210/632 (2013.01);
Abstract
A technique includes receiving seismic data acquired in a seismic survey. The technique includes determining a geophysical trend of trace amplitudes indicated by the seismic data based on non-linear regression and performing quality control analysis on the seismic data based on the determined trend.
Liu, Qinglin. (2014). Technique and apparatus for seismic data quality control using non-linear regression analysis (U.S. Patent No. 8902706). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8902706
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile