The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 02, 2014

Filed:

Jun. 14, 2011
Applicants:

Yong-hwa Park, Yongin-si, KR;

Jang-woo You, Yongin-si, KR;

Yong-chul Cho, Suwon-si, KR;

Inventors:

Yong-hwa Park, Yongin-si, KR;

Jang-woo You, Yongin-si, KR;

Yong-chul Cho, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 17/36 (2006.01); G01S 17/89 (2006.01); G01S 7/487 (2006.01); G01S 17/87 (2006.01); G01C 3/08 (2006.01);
U.S. Cl.
CPC ...
G01S 17/36 (2013.01); G01S 17/87 (2013.01); G01S 7/487 (2013.01); G01S 17/89 (2013.01);
Abstract

A 3 dimensional (3D) image acquisition apparatus and a method of extracting depth information in the 3D image acquisition apparatus are provided. The method of extracting depth information includes sequentially projecting N (N is a natural number equal to or greater than 3) different pieces of projection light onto a object; modulating N pieces of reflection light reflected from the object with an optical modulation signal having a gain waveform; generating N images by capturing the N pieces of modulated reflection light; generating a first averaged image by multiplying the N images by primary weights and generating a second averaged image by multiplying the N images by secondary weights; acquiring an average phase delay from the first and second averaged images; and calculating a distance to the object from the average phase delay.


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