The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 02, 2014

Filed:

Jan. 30, 2013
Applicant:

Altasens, Inc., Westlake Village, CA (US);

Inventor:

Naveen Kolli, Thousand Oaks, CA (US);

Assignee:

AltaSens, Inc., Westlake Village, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 9/64 (2006.01); H04N 5/217 (2011.01); H04N 5/235 (2006.01); H04N 5/228 (2006.01); H04N 5/367 (2011.01);
U.S. Cl.
CPC ...
H04N 5/367 (2013.01);
Abstract

Various technologies described herein pertain to defect pixel correction for image data collected by a pixel array of an image sensor with spatially arranged exposures. The pixel array includes a first subset of pixels having a first exposure time and a second subset of pixels having a second exposure time. An exposure ratio (ratio of first exposure time to second exposure time) is received. A value of at least a particular neighbor pixel of a given pixel from the image data is adjusted based upon the exposure ratio. Neighborhood statistics for the given pixel from the image data are computed based on values of neighbor pixels of the given pixel from the image data as adjusted. Whether the value of the given pixel is defective is detected based on the neighborhood statistics. The value of the given pixel is replaced when detected to be defective to output modified image data.


Find Patent Forward Citations

Kolli, Naveen. (2014). Dynamic, local edge preserving defect pixel correction for image sensors with spatially arranged exposures (U.S. Patent No. 8902336). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8902336

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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