The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 02, 2014
Filed:
Aug. 23, 2011
Bernhard Rinner, St. Radegund, AT;
Markus Quaritsch, Grosspetersdorf, AT;
Daniel Wischounig-strucl, Klagenfurt, AT;
Saeed Yahyanejad, Klagenfurt, AT;
Bernhard Rinner, St. Radegund, AT;
Markus Quaritsch, Grosspetersdorf, AT;
Daniel Wischounig-Strucl, Klagenfurt, AT;
Saeed Yahyanejad, Klagenfurt, AT;
Lakeside Labs GmbH, Klagenfurt, AT;
Abstract
An apparatus for generating an overview image of a plurality of images comprises a storage unit and an image processor. The storage unit stores a plurality of processed images of the overview image and is able to provide the overview image containing the plurality of processed images at their assigned positions for displaying. The image processor determines feature points of a new image and compares the determined feature points of the new image with feature points of a stored processed image to identify common feature points and to obtain 3-dimensional positions of the common feature points. Further, the image processor determines common feature points located within a predefined maximum distance of relevance to a reference plane based on the 3-dimensional positions of the common feature points to identify relevant common feature points. Further, the image processor processes the new image by assigning the new image to a position in the overview image based on a comparison of an image information of each relevant common feature point of the new image with an image information of each corresponding relevant common feature point of the stored processed image without considering common feature points located beyond the predefined maximum distance of relevance to the reference plane.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile