The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 02, 2014
Filed:
Sep. 30, 2013
Bertec Corporation, Columbus, OH (US);
Todd Christopher Wilson, Columbus, OH (US);
Necip Berme, Worthington, OH (US);
Bertec Corporation, Columbus, OH (US);
Abstract
A measurement and testing system includes a measurement assembly having at least one measurement device, at least one visual display device, and a data acquisition and processing device operatively coupled to the at least one measurement device of the measurement assembly and the visual display device. In one embodiment, the data acquisition and processing device is configured to generate one or more global reports utilizing the output of the measurement assembly, generate an information icon on the output screen of the visual display device, and assign the one or more global reports to the information icon. In other embodiments, the data acquisition and processing device is configured to automatically regulate the availability of tests based upon a requisite measurement assembly or a predetermined condition, and/or determine whether the output data from a plurality of measurement assemblies is to be combined so as to create a single virtual measurement assembly.