The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 02, 2014
Filed:
Aug. 09, 2012
Guang Hai Jin, Yongin, KR;
Jae-beom Choi, Yongin, KR;
Kwan-wook Jung, Yongin, KR;
June-woo Lee, Yongin, KR;
Hae-yeon Lee, Yongin, KR;
Jae-hwan OH, Yongin, KR;
Seong-jun Kim, Yongin, KR;
Guang hai Jin, Yongin, KR;
Jae-Beom Choi, Yongin, KR;
Kwan-Wook Jung, Yongin, KR;
June-Woo Lee, Yongin, KR;
Hae-Yeon Lee, Yongin, KR;
Jae-Hwan Oh, Yongin, KR;
Seong-Jun Kim, Yongin, KR;
Samsung Display Co., Ltd., Yongin, Gyeonggi-Do, KR;
Abstract
A method for testing an array for a pixel circuit of an organic light emitting diode display, which includes a first transistor that transmits a driving current corresponding to a data signal to an organic light emitting diode according to a scan signal and at least one capacitor, uses an array test device having a control device and a driver. The method includes performing a first irradiation of electron beams to an exposed portion of a first electrode of the at least one capacitor before manufacturing of the organic light emitting diode is completed, calibrating the control device of the array test device based on secondary electrons output by the at least one capacitor, performing a second irradiation of electron beams to an anode of the pixel circuit, and detecting whether the first transistor is normally operated based on an output amount of secondary electrons output by the anode.