The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 02, 2014
Filed:
Dec. 22, 2011
Phillip D. Jones, Raleigh, NC (US);
Thomas D. Pahel, Jr., Raleigh, NC (US);
Adam J. Parker, Cary, NC (US);
Adrian X. Rodriguez, Durham, NC (US);
Phillip D. Jones, Raleigh, NC (US);
Thomas D. Pahel, Jr., Raleigh, NC (US);
Adam J. Parker, Cary, NC (US);
Adrian X. Rodriguez, Durham, NC (US);
Lenovo Enterprise Solutions (Singapore) Pte. Ltd., Singapore, SG;
Abstract
A method of testing an electronic device includes measuring radio frequency emissions at a plurality of positions relative to a trusted unit of a particular electronicdevice during operation of the trusted unit, and measuring radio frequency emissions at the same plurality of positions relative to a second unit of the particular electronic device. For each of the plurality of positions, the radio frequency emissions measured from the second unit are compared to the radio frequency emissions measured from the trusted unit. The method then determines whether there is any frequency at which the measured amplitude of the radio frequency emissions from the second unit and the measured amplitude of the radio frequency emissions from the trusted unit exhibit a statistically significant difference.