The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 02, 2014

Filed:

Sep. 17, 2010
Applicants:

Michael J. Lane, Baldwinsville, NY (US);

Brian D. Faldasz, Littleton, MA (US);

Jerrie Gavalchin, Groton, NY (US);

Inventors:

Michael J. Lane, Baldwinsville, NY (US);

Brian D. Faldasz, Littleton, MA (US);

Jerrie Gavalchin, Groton, NY (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12M 1/00 (2006.01); C12M 1/34 (2006.01); C12Q 1/68 (2006.01); G01N 33/53 (2006.01); G01N 33/542 (2006.01); C07H 21/02 (2006.01); G01N 21/75 (2006.01); B01L 3/00 (2006.01); G01N 33/569 (2006.01); G01N 33/558 (2006.01);
U.S. Cl.
CPC ...
G01N 33/558 (2013.01); G01N 33/56972 (2013.01);
Abstract

The invention provides reagents and methods for lateral flow assays and quantitative capture or determination of components, including cells, in a sample. In one aspect, reagents and methods for diagnostic assay are provided. In one embodiment an assay for determining T cell numbers, particularly a CD2+ CD4+ T cell assay is provided. A manufacturing method for producing rapid diagnostic assays in a decentralized manner is also described. The method generates net economic advantages over conventional diagnostic manufacturing practices.


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