The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 02, 2014

Filed:

Mar. 17, 2009
Applicants:

Masahiro Yanagisawa, Tokyo, JP;

Takuya Nakanishi, Tokyo, JP;

Naonobu Shimamoto, Tokyo, JP;

Mikiko Saito, Tokyo, JP;

Tetsuya Osaka, Tokyo, JP;

Inventors:

Masahiro Yanagisawa, Tokyo, JP;

Takuya Nakanishi, Tokyo, JP;

Naonobu Shimamoto, Tokyo, JP;

Mikiko Saito, Tokyo, JP;

Tetsuya Osaka, Tokyo, JP;

Assignee:

Waseda University, Tokyo, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/543 (2006.01); G01N 21/55 (2014.01); G01N 21/65 (2006.01);
U.S. Cl.
CPC ...
G01N 21/554 (2013.01); G01N 21/658 (2013.01);
Abstract

There is provided a novel optical sensor utilizing a surface plasmon resonance technique which is capable of detecting a substance to be detected with high sensitivity independently of a wavelength of irradiated light and is capable of obtaining information, other than a refraction index, on the substance to be detected. At the center of a surface of a metallic filmwhich is formed on a substrate and has no aperture, a circular depressionwith a diameter of 0.1 to 250 nm is formed and with the depressiondefined as a center, a plurality of depressionsare concentrically formed at intervals of 450 to 530 nm.


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