The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 02, 2014

Filed:

Oct. 01, 2010
Applicants:

Won-hyouk Jang, Yongin, KR;

Eu-gene Kang, Yongin, KR;

Joo-hwa Lee, Yongin, KR;

Min-jeong Hwang, Yongin, KR;

Inventors:

Won-Hyouk Jang, Yongin, KR;

Eu-Gene Kang, Yongin, KR;

Joo-Hwa Lee, Yongin, KR;

Min-Jeong Hwang, Yongin, KR;

Assignee:

Samsung Display Co., Ltd., Giheung-Gu, Yongin, Gyeonggi-Do, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C23C 16/52 (2006.01); C23C 16/448 (2006.01); C23C 16/44 (2006.01); C23C 16/00 (2006.01); B05C 11/00 (2006.01);
U.S. Cl.
CPC ...
C23C 16/00 (2013.01); B05C 11/00 (2013.01); C23C 16/52 (2013.01); C23C 16/44 (2013.01); C23C 16/448 (2013.01);
Abstract

A device for manufacturing a display device includes a deposition source; a deposition thickness calculator for calculating a deposition thickness of a deposition material deposited on a substrate; and a controller for controlling a power of a heater which heats the deposition source by comparing the deposition thickness calculated with a reference thickness. The controller controls the power of the heater either at least one time for each substrate on which the thin film is to be deposited or at regular intervals while the deposition material is deposited. Influence of measurement noise that is included in a quartz crystal sensor for measuring a deposition speed may be minimized, and distribution of deposition thickness of an organic light emitting material may be reduced, thereby increasing the yield of the deposition process and producing quality display devices.


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