The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8899106 B1

PDF
Full Text
Expired
Date of Patent:
Dec. 02, 2014

Filed:

Feb. 13, 2012
Applicants:

Dae-song Cheon, Daejeon, KR;

Yong-bok Jung, Daejeon, KR;

Won-kyong Song, Daejeon, KR;

Inventors:

Dae-Song Cheon, Daejeon, KR;

Yong-Bok Jung, Daejeon, KR;

Won-Kyong Song, Daejeon, KR;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
E21B 47/00 (2012.01); G01M 5/00 (2006.01);
U.S. Cl.
CPC ...
G01M 5/0083 (2013.01); G01M 5/0041 (2013.01);
Abstract

A method and apparatus are provided for detecting a structural stability of an object area. The method and apparatus include disposing a plurality of electrodes in the object area along a depth direction of the object area, surrounding the electrodes with a filling material; measuring a micro potential difference via the electrodes, generating a micro potential difference when the filling material is deformed by a force according to a change of the object area; and determining the structural stability of the object area based upon the measured micro potential difference.


Find Patent Forward Citations

Cheon, Dae-Song. (2014). Method for detecting structural stability of object area and apparatus for the same (U.S. Patent No. 8899106). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8899106

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