The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 02, 2014

Filed:

Dec. 17, 2013
Applicants:

Scott Manalis, Cambridge, MA (US);

Andrea K. Bryan, Allston, MA (US);

Philip Dextras, Cambridge, MA (US);

Sungmin Son, Boston, MA (US);

Thomas Burg, Goettingen, DE;

William Grover, Medford, MA (US);

Yao-chung Weng, Cambridge, MA (US);

Inventors:

Scott Manalis, Cambridge, MA (US);

Andrea K. Bryan, Allston, MA (US);

Philip Dextras, Cambridge, MA (US);

Sungmin Son, Boston, MA (US);

Thomas Burg, Goettingen, DE;

William Grover, Medford, MA (US);

Yao-Chung Weng, Cambridge, MA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/10 (2006.01); G01N 9/00 (2006.01); G01N 15/12 (2006.01);
U.S. Cl.
CPC ...
G01N 9/002 (2013.01); G01N 2015/1043 (2013.01); G01N 15/1056 (2013.01); G01N 2015/1087 (2013.01); G01N 15/12 (2013.01);
Abstract

Methods and apparatus for improving measurements of particle or cell characteristics, such as mass, in Suspended Microchannel Resonators (SMR's). Apparatus include in particular designs for trapping particles in SMR's for extended measurement periods. Methods include techniques to provide differential measurements by varying the fluid density for repeated measurements on the same particle or cell.


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