The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 25, 2014

Filed:

Oct. 24, 2008
Applicants:

Ning Chen, Austin, TX (US);

Christopher J. Daniels, Cedar Park, TX (US);

Leo G. Dehner, Austin, TX (US);

Gregory C. NG, Austin, TX (US);

Wendy F. Reed, Austin, TX (US);

Inventors:

Ning Chen, Austin, TX (US);

Christopher J. Daniels, Cedar Park, TX (US);

Leo G. Dehner, Austin, TX (US);

Gregory C. Ng, Austin, TX (US);

Wendy F. Reed, Austin, TX (US);

Assignee:

Freescale Semiconductor, Inc, Austin, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/14 (2006.01);
U.S. Cl.
CPC ...
G06F 17/142 (2013.01);
Abstract

A data reordering system for determining addresses associated with a vector of transformed data and corresponding method of reordering transformed data, where the data reordering system includes: a first transform function coupled to a data vector and operable to provide the vector of transformed data; a reordering function, including a plurality of counters, that is operable to determine a plurality of offset addresses, with a, respective, offset address for each element in the vector of transformed data; and an adder operable to add a base address that corresponds to the first address to the each, respective, offset address to provide a sequence of addresses suitable for accessing the vector of transformed data to provide a re-sequenced vector of transformed data.


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