The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 2014
Filed:
Apr. 17, 2014
Visier Solutions, Inc., Vancouver, CA;
Geoffrey Zenger, New Westminster, CA;
Philipp Ziegler, Vancouver, CA;
Visier Solutions, Inc., Vancouver, British Columbia, GB;
Abstract
A particular method includes selecting a subset of a plurality of dimension members of a multi-dimensional data set. The method also includes computing a plurality of dimensional scores for the dimension members in the selected subset. Each dimensional score is associated with a particular dimension member in the subset and is a measure of a dimensional influence of the associated dimension member on a metric associated with the multi-dimensional data set. A dimension member with greater dimensional influence affects a value of the metric over a population more than a dimension member with less dimensional influence. The method further includes ranking the dimension members in the selected subset based on the dimensional scores.