The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 2014
Filed:
Mar. 07, 2012
Tomotaka Katano, Nagoya, JP;
Chiyo Koga, Nagoya, JP;
Takashi Hirata, Nagoya, JP;
Satoko Hishida, Nagoya, JP;
Masayuki Hori, Gifu, JP;
Tomotaka Katano, Nagoya, JP;
Chiyo Koga, Nagoya, JP;
Takashi Hirata, Nagoya, JP;
Satoko Hishida, Nagoya, JP;
Masayuki Hori, Gifu, JP;
Brother Kogyo Kabushiki Kaisha, Nagoya, JP;
Abstract
A sewing data creation apparatus includes an area specification portion that specifies at least one area in which a plurality of stitches are to be formed and a sewing data creation portion that creates sewing data for forming the plurality of stitches in each of the specified at least one area and for forming an overlapping portion in a case where the specified at least one area includes a first area and a second area. The overlapping portion is a region in which at least one of the first area and the second area is enlarged in a direction that extends across a boundary line, such that a portion of the plurality of stitches to be formed in the first area is one of intersected and overlapped by a portion of the plurality of stitches to be formed in the second area.