The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 2014
Filed:
Jan. 13, 2012
Applicants:
Yuanyuan Ding, Santa Clara, CA (US);
Jing Xiao, Cupertino, CA (US);
Inventors:
Yuanyuan Ding, Santa Clara, CA (US);
Jing Xiao, Cupertino, CA (US);
Assignee:
Seiko Epson Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/56 (2006.01); G06K 9/46 (2006.01); G06K 9/66 (2006.01); G06K 9/52 (2006.01);
U.S. Cl.
CPC ...
G06K 9/4671 (2013.01); G06K 9/527 (2013.01); G06K 9/4642 (2013.01);
Abstract
Systems and methods for object detection are presented herein. Embodiments of the present invention utilizing a cascade feature, one or more features at different scales, one or more multi-scale features in combination with a perspective feature, or combinations thereof to detect an object of interest in an input image. In embodiments, the various features are used to train classifiers. In embodiments, the trained classifiers are used in detecting an object of interest in one or more input images.