The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 2014
Filed:
Oct. 31, 2011
Steven Oeckl, Erlangen, DE;
Werner Schön, Erlangen, DE;
Holger Schnell, Vaihingen, DE;
Gustav Müller, Esslingen, DE;
Ioannis Papadopoulos, Winnenden, DE;
Steven Oeckl, Erlangen, DE;
Werner Schön, Erlangen, DE;
Holger Schnell, Vaihingen, DE;
Gustav Müller, Esslingen, DE;
Ioannis Papadopoulos, Winnenden, DE;
MAHLE International GmbH, Stuttgart, DE;
Abstract
In a method and an evaluation device for determining the position of a structure located in an object to be investigated by means of X-ray computer tomography, a cutting data record, which images the object in a cutting plane, is determined from a volume data record of the object. The cutting data record is binarized to form a binary data record, in which the structure voxels imaging the structure and the surface voxels imaging an object surface are determined. To determine the position, a distance data record is produced in such a way that a distance value, which characterizes the smallest distance of the respective distance voxel from the surface voxels, is assigned to each distance voxel of the distance data record. The distance voxels corresponding to the structure voxels are then determined and the associated distance values evaluated.