The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 2014
Filed:
Aug. 15, 2012
Naoki Hasegawa, Kyoto, JP;
Naoki Hasegawa, Kyoto, JP;
Shimadzu Corporation, Kyoto, JP;
Abstract
An X-ray apparatus includes a pixel-extracting section for extracting pixels determined in advance in each line of an image containing a grid moiré pattern, a FFT processing section for performing one-dimensional FFT to the extracted pixels, a peak-frequency detecting section for detecting a peak frequency from a frequency characteristic for each line having undergone FTT, a frequency-characteristic preparing section for preparing a frequency characteristic for extracting the grid moiré pattern in accordance with the detected peak-frequency, an inverse FFT processing section for performing inverse FFT to the frequency characteristic prepared by the frequency-characteristic preparing section, and an FIR filtering section for performing FIR filtering on the image with use of a value calculated by the inverse FFT processing section as an FIR filter coefficient.