The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 2014
Filed:
Dec. 09, 2010
Bernhard Wieneke, Goettingen, DE;
Bernhard Wieneke, Goettingen, DE;
Lavision GmbH, Goettingen, DE;
Abstract
The invention relates to a method for determining a set of optical imaging functions that describe the imaging of a measuring volume onto each of a plurality of detector surfaces on which the measuring volume can be imaged at in each case a different observation angle by means of detection optics. In addition to the assignment of in each case one image position (x, y) to each volume position (X, Y, Z), the method according to the invention envisages that the shape of the image of a punctiform particle in the measuring volume be described by shape parameter values (a, b, 100 , I) and that the corresponding set of shape parameter values be assigned to each volume position (X, Y. Z) for each detector surface.