The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 2014
Filed:
Dec. 14, 2012
Gii Acquisition, Llc, Davisburg, MI (US);
Michael G. Nygaard, Fenton, MI (US);
Kyle M. Harmer, Swartz Creek, MI (US);
Nathan Andrew-Paul Kujacznski, Flint, MI (US);
James W. St. Onge, Bloomfield Hills, MI (US);
GII Acquisition, LLC, Davisburg, MI (US);
Abstract
A high-speed, 3-D method and system for optically measuring a geometric dimension of manufactured parts such as cartridge cases are provided. The method includes consecutively transferring the parts so that the parts travel along a path which extends to a vision station at which each part has a predetermined position and orientation for optical measuring. A line of radiation having a predetermined orientation is projected onto spaced apart end surfaces of the part to obtain reflected line segments of radiation from the end surfaces of the part. The reflected line segments of radiation are detected at one or more image planes to obtain electrical signals and the electrical signals are processed to determine the geometric dimension such as primer pocket depth.