The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 2014
Filed:
Mar. 13, 2012
Zhijia Yuan, River Edge, NJ (US);
Zhenguo Wang, Fort Lee, NJ (US);
Kinpui Chan, Ridgewood, NJ (US);
Kabushiki Kaisha Topcon, Tokyo, JP;
Abstract
An optical imaging method in an embodiment includes: a scanning step to scan each of a plurality of A-lines of an object with a signal light while alternately changing the phase difference between the signal light and a reference light to two preset phase differences; a detection step to detect the interference light of the signal light passing through the A-line and the reference light; and an imaging step to generate a complex interference spectrum based on the detection results of the interference lights corresponding to the plurality of A-lines sequentially obtained in the detection step according to the scanning, and form, based on the complex interference spectrum, the tomographic image along the arrangement of the plurality of A-lines in which a complex conjugate artifact is substantially removed.