The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 2014
Filed:
Jan. 15, 2010
Dominique Pagnoux, Limoges, FR;
Frédéric Louradour, Eymoutiers, FR;
Jérôme Desroches, Limoges, FR;
Alain Barthelemy, Limoges, FR;
Julien Brevier, Saint-Junien, FR;
Dominique Pagnoux, Limoges, FR;
Frédéric Louradour, Eymoutiers, FR;
Jérôme Desroches, Limoges, FR;
Alain Barthelemy, Limoges, FR;
Julien Brevier, Saint-Junien, FR;
Centre National de la Recherche Scientifique-CNRS, Paris Cedex, FR;
Abstract
The invention relates to a method and to a device for determining at least one piece of polarization information on a measurement point of a target sample, the device comprising:—a light source capable of emitting a rectilinearly polarized light beam, the light beam being intended to be reflected by the measurement point;—a means for computing polarization information on the measurement point using the beam reflected by the target sample;—at least one waveguide for guiding the incident beam towards the target sample and the reflected beam towards the computing means; and—a means for rotating the polarization, capable of rotating two orthogonal polarimetric components of the incident beam after passing through the waveguide and two orthogonal polarimetric components of the reflected beam before passing through the waveguide.