The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 2014
Filed:
Oct. 06, 2010
Markku Ojala, Turku, FI;
Jyrki Laitinen, Kuusisto, FI;
Christer Isaksson, Turku, FI;
Tommi Elo, Turku, FI;
Markku Ojala, Turku, FI;
Jyrki Laitinen, Kuusisto, FI;
Christer Isaksson, Turku, FI;
Tommi Elo, Turku, FI;
Wallac Oy, Turku, FI;
Abstract
An optical measurement instrument includes: an excitation light source () arranged to produce an excitation beam for at least one of samples to be measured and a detector () arranged to detect an emission beam emitted by one of the samples to be measured and to produce a detection signal responsive to the detected emission beam. The optical measurement instrument further includes an arrangement for controlling temperature of the samples to be measured. The arrangement includes: one or more temperature sensors () for producing one or more temperature signals responsive to temperature of a measurement chamber () of the optical measurement instrument, one or more heating resistors (-) arranged to warm the measurement chamber, and a controller () arranged to control electrical power supplied to the heating resistors on the basis of the one or more temperature signals.