The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8896338 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 25, 2014

Filed:

Jun. 14, 2012
Applicant:

Emil Kamieniecki, Bedford, MA (US);

Inventor:

Emil Kamieniecki, Bedford, MA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for characterizing the electronic properties of a semiconductor sample by exploiting transients in measured photoconductance, the transients being induced by illuminating the semiconductor sample with a small probing illumination that is superimposed over a larger background illumination. In one embodiment, a pulse-type probing illumination is utilized, with either the intensity of the probing illumination being gradually reduced or the intensity of the background illumination being gradually increased until the measured photoconductance rise and decay in the sample are substantially exponential. In another embodiment, a continuous probing illumination with a sinusoidally-modulated intensity is utilized, the modulated intensity of the probing illumination being gradually adjusted until the measured photoconductance is linearly dependent thereupon.


Find Patent Forward Citations

Kamieniecki, Emil. (2014). Electrical characterization of semiconductor materials (U.S. Patent No. 8896338). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8896338

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