The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 2014
Filed:
Jul. 25, 2011
Yuichi Taguchi, Kariya, JP;
Tsuyoshi Koike, Kariya, JP;
Atsushi Yamaguchi, Kariya, JP;
Abstract
The abnormality detection system is provided for detecting an abnormality of an object. The abnormality detection system includes a high-frequency power source, a primary coil, a secondary coil and a controller. The high-frequency power source supplies power. The primary coil receives the power supplied from the high-frequency power source. The secondary coil is mounted to the object in noncontact with the primary coil for receiving power supplied from the primary coil. The controller is operable to detect the power received by the secondary coil and also to determine whether or not an abnormality is present in the object based on the detected power.