The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 2014
Filed:
Mar. 16, 2012
Jan Ole Blumhagen, Erlangen, DE;
Matthias Fenchel, Erlangen, DE;
Ralf Ladebeck, Erlangen, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
According to an embodiment of a method, a first readout gradient field is determined in such a way that a distortion caused by a non-linearity of the first readout gradient field and a distortion caused by a Bfield inhomogeneity are essentially cancelled at a first location of a field of view of the magnetic resonance facility. Moreover, a second readout gradient field is determined in such a way that a distortion caused by a non-linearity of the second readout gradient field and a distortion caused by a Bfield inhomogeneity are essentially cancelled at a different second location of the field of view. Finally, a multiecho sequence is performed, wherein first magnetic resonance data is captured using the first readout gradient field after a 180° pulse and second magnetic resonance data is captured using the second readout gradient field after a further 180° pulse.