The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8895840 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 25, 2014

Filed:

Jul. 23, 2009
Applicant:

Hiroyuki Suto, Numazu, JP;

Inventor:

Hiroyuki Suto, Numazu, JP;

Assignee:

Toyota Jidosha Kabushiki Kaisha, Toyota-shi, Aichi-ken, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 31/06 (2012.01); H01L 31/02 (2006.01); H01L 31/075 (2012.01); H01L 31/0352 (2006.01);
U.S. Cl.
CPC ...
H01L 31/075 (2013.01); H01L 31/035218 (2013.01); Y02E 10/548 (2013.01); Y10S 977/932 (2013.01); Y10S 977/948 (2013.01);
Abstract

A main object of the present invention is to provide a photoelectric conversion device which is capable of improving the photoelectric conversion efficiency. The invention comprises: a p-layer; an n-layer; an i-layer disposed between the p-layer and the n-layer; a first electrode connected to the p-layer; and a second electrode connected to the n-layer, wherein the i-layer comprises a wall layer constituted by a first semiconductor, and a quantum structure portion constituted by a second semiconductor disposed in the wall layer; a band gap of the first semiconductor is wider than that of the second semiconductor; when a concentration of the n-type impurity that may be contained in the middle of the i-layer in a thickness direction thereof is defined as Cn, a concentration of the n-type impurity that may be contained in the region on the p-layer side of the i-layer is defined as Cn, a concentration of the p-type impurity that may be contained in the middle of the i-layer in a thickness direction thereof is defined as Cp, and a concentration of the p-type impurity that may be contained in the region on the n-layer side of the i-layer is defined as Cp, the relations Cn<Cnand/or Cp<Cpare satisfied.


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Suto, Hiroyuki. (2014). Photoelectric conversion device (U.S. Patent No. 8895840). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8895840

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