The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 25, 2014

Filed:

Nov. 22, 2011
Applicant:

Joerg Haechler, Oberwil b. Zug, CH;

Inventor:

Joerg Haechler, Oberwil b. Zug, CH;

Assignee:

Roche Diagnostics Operations, Inc., Indianapolis, IN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01N 31/00 (2006.01); G01N 33/00 (2006.01); G01N 35/02 (2006.01); G01N 35/04 (2006.01);
U.S. Cl.
CPC ...
G01N 35/04 (2013.01); G01N 2035/0467 (2013.01); G01N 35/026 (2013.01);
Abstract

A junction for transporting sample racks in an analytical system having one or more work cells for processing samples and a method thereof are disclosed. In one embodiment, the junction may include multiple main transport lines, a turntable and one or more bypass transport lines. The multiple main transport lines can transport first sample racks and second sample racks having different sizes. The rotatable transport line can alternately connect to one or more of the main transport lines. Each of the one or more bypass transport lines can interconnect two of the main transport lines and bypass the turntable. Each of the bypass transport lines can be curved such that transport of the second sample racks through each of the bypass transport lines is enabled and transport of the first sample racks through each of the bypass transport lines is disabled.


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