The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 2014
Filed:
Mar. 07, 2012
Vernon G. Wong, Menlo Park, CA (US);
Douglas A. Lee, Menlo Park, CA (US);
Vernon G. Wong, Menlo Park, CA (US);
Douglas A. Lee, Menlo Park, CA (US);
Orthomems, Inc., Menlo Park, CA (US);
Abstract
An implantable device for measuring IOP comprises a distal portion, a proximal portion and a conformable elongate support extending between the distal and proximal portions. The distal portion comprises a pressure sensor, for example a capacitor, and the proximal portion comprises a coil. The conformable elongate support extends between the distal portion and the coil so as to couple the distal portion to the coil, and the conformable elongate support is sized to position the sensor in the anterior chamber when the proximal portion is positioned under a conjunctiva of the eye. Positioning of the pressure sensor in the anterior chamber has the benefit of readily accessible surgical access and a direct measurement of the IOP of the eye. The proximal portion comprising the coil can be configured to place the coil between the sclera and the conjunctiva, such that the invasiveness of the surgery can be decreased substantially.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile