The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 2014
Filed:
Mar. 29, 2013
Vicoh, Llc, San Diego, CA (US);
Jerome Legerton, San Diego, CA (US);
Vicoh, LLC, San Diego, CA (US);
Abstract
This application describes a kit of contact lenses comprising two or more contact lenses having a known higher order aberration for each given lens power. By way of example, the higher order aberration may comprise a spherical aberration, a coma aberration, or a trefoil aberration. A practitioner selects a lens from the kit and applies the lens to a patient's eye and measures a residual higher order aberration of the lens-eye system. In cases where the residual higher order aberration exceeds a predetermined magnitude, the practitioner selects a second lens from the kit, applies the second lens to the patient's eye and measures the residual higher order aberration of the lens-eye system.