The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 2014
Filed:
Mar. 07, 2013
Applicant:
Optovue, Inc., Fremont, CA (US);
Inventors:
Michael Hee, Burlingame, CA (US);
Jay Wei, Fremont, CA (US);
Ben Jang, Cupertino, CA (US);
Tony Ko, Cupertino, CA (US);
Assignee:
Optovue, Inc., Fremont, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/14 (2006.01); A61B 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
An imaging method is disclosed. An imaging method according to some embodiments can include obtaining a plurality of measurements of an eye for at least one location by scanning optical radiation across the eye; determining a preferred measurement axis from the plurality of measurements; and processing the plurality of measurements to obtain information of the eye.