The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 18, 2014
Filed:
Jul. 02, 2012
Applicants:
Mark C. Reuter, Montrose, NY (US);
Brian A. Bryce, Ithaca, NY (US);
Bojan R. Ilic, Ithaca, NY (US);
Sandip Tiwari, Ithaca, NY (US);
Inventors:
Mark C. Reuter, Montrose, NY (US);
Brian A. Bryce, Ithaca, NY (US);
Bojan R. Ilic, Ithaca, NY (US);
Sandip Tiwari, Ithaca, NY (US);
Assignees:
International Business Machines Corporation, Armonk, NY (US);
Cornell University, Ithaca, NY (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01Q 70/12 (2010.01); G01Q 70/10 (2010.01); B82Y 15/00 (2011.01);
U.S. Cl.
CPC ...
G01Q 70/10 (2013.01); G01Q 70/12 (2013.01); B82Y 15/00 (2013.01);
Abstract
A probe for scanned probe microscopy is provided. The probe includes a cantilever beam and a tip. The cantilever beam extends along a generally horizontal axis. The cantilever beam has a crystal facet surface that is oriented at a tilt angle with respect to the generally horizontal axis. The tip projects outwardly from the crystal facet surface.