The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 18, 2014
Filed:
Sep. 11, 2009
Kathryn A. Bassin, Endicott, NY (US);
Howard M. Hess, Chicago, IL (US);
Sheng Huang, Shanghai, CN;
Steven Kagan, Oakbrook Terrace, IL (US);
Shao C. LI, Beijing, CN;
Zhong J. LI, Beijing, CN;
He H. Liu, Beijing, CN;
Susan E. Skrabanek, Atlanta, GA (US);
Hua F. Tan, Beijing, CN;
LI Wang, Beijing, CN;
Jun Zhu, Shanghai, CN;
Kathryn A. Bassin, Endicott, NY (US);
Howard M. Hess, Chicago, IL (US);
Sheng Huang, Shanghai, CN;
Steven Kagan, Oakbrook Terrace, IL (US);
Shao C. Li, Beijing, CN;
Zhong J. Li, Beijing, CN;
He H. Liu, Beijing, CN;
Susan E. Skrabanek, Atlanta, GA (US);
Hua F. Tan, Beijing, CN;
Li Wang, Beijing, CN;
Jun Zhu, Shanghai, CN;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method includes generating a test model based on at least one of test group dependencies and test group constraints and generating a resource base. The method includes generating a cost model and generating a resource allocation plan based on the test model, the resource base, and the cost model.