The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 18, 2014
Filed:
Jun. 08, 2007
Applicants:
John O. Louch, San Luis Obispo, CA (US);
Christopher Hynes, Santa Cruz, CA (US);
Timothy Wayne Bumgarner, Sharpsburg, MD (US);
Eric Steven Peyton, Lisle, IL (US);
Inventors:
John O. Louch, San Luis Obispo, CA (US);
Christopher Hynes, Santa Cruz, CA (US);
Timothy Wayne Bumgarner, Sharpsburg, MD (US);
Eric Steven Peyton, Lisle, IL (US);
Assignee:
Apple Inc., Cupertino, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 3/14 (2006.01); G06F 3/048 (2013.01); G06F 3/0481 (2013.01);
U.S. Cl.
CPC ...
G06F 3/0481 (2013.01);
Abstract
Systems and methods for providing an overflow stack. An overflow stack can be generated based upon adjustments to a group display area and based upon application of one or more display criterion. An overflow stack can include representation of any system objects that can not be displayed in an adjusted group display area based upon the one or more display criterion.