The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2014

Filed:

Sep. 27, 2012
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Miho Iwanaga, Tokyo, JP;

Masahiko Yamauchi, Tokyo, JP;

Daisuke Nakayama, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A failure detection method including: detecting, by a virtual computer, occurrence of the failure in a virtual function of an I/O device; acquiring, a virtual device name corresponding to the virtual function in which the failure has occurred; referring, to device information retaining a virtual device name of the I/O device assigned to the virtual computer and VF specific information on the I/O device, thereby acquiring the VF specific information based on the acquired virtual device name; transmitting, the acquired VF specific information to the host; referring, by the host, to I/O correspondence information retaining a slot number of a slot in which the I/O device is mounted, and VF specific information, thereby acquiring the slot number corresponding to the VF specific information received from the virtual computer; and identifying, the acquired slot number as the slot number of the I/O device on which the failure has occurred.


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