The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2014

Filed:

Apr. 16, 2012
Applicants:

Eugenie L. Alexander, Spokane, WA (US);

Arthur J. Bariska, Jr., Tucson, AZ (US);

Matthew T. Cousens, Catskill, NY (US);

Eileen S. Kovalchick, Tucson, AZ (US);

Joel L. Masser, San Jose, CA (US);

Kevin D. Mckenzie, Poughkeepsie, NY (US);

Eileen P. Tedesco, Sharon, CT (US);

Inventors:

Eugenie L. Alexander, Spokane, WA (US);

Arthur J. Bariska, Jr., Tucson, AZ (US);

Matthew T. Cousens, Catskill, NY (US);

Eileen S. Kovalchick, Tucson, AZ (US);

Joel L. Masser, San Jose, CA (US);

Kevin D. McKenzie, Poughkeepsie, NY (US);

Eileen P. Tedesco, Sharon, CT (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for testing using a preserve status parameter in a computing system includes setting, by a calling process in the computing system, the preserve status parameter; issuing a call to a function under test by the calling process in the computing system; executing the function under test in the computing system, wherein data in a memory area accessed by the function under test during execution is preserved by the set preserve status parameter, such that the computing system does not reuse the memory area while the data in the memory area is being preserved; determining if an error occurred during execution of the function under test; in the event an error is determined to have occurred during execution of the function under test, making the data in the memory area available for inspection; and releasing the memory area for reuse by the computing system.


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