The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2014

Filed:

Nov. 21, 2012
Applicant:

Hewlett-packard Development Company, L.p., Houston, TX (US);

Inventors:

Mohamed Belhadj, Eagle, ID (US);

Charles Franklin Randall, Boulder, CO (US);

Douglas James Cameron, Bellevue, WA (US);

Siamak Nazari, Mountain View, CA (US);

Douglas L. Voigt, Boise, ID (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/20 (2006.01);
U.S. Cl.
CPC ...
G06F 11/2094 (2013.01);
Abstract

Optimization of a RAID volume is described. In an example, a method of optimizing a redundant array of independent disks (RAID) volume includes: identifying a RAID level used for a plurality of disks in the RAID volume; defining a relation among rebuild rate, scrub rate, and annualized data loss event rate (ADLER) for the RAID volume using constant values and the RAID level; selecting a value for the ADLER; applying a policy to the relation to choose a value for one of the rebuild rate or the scrub rate; and determining a value for the other of the rebuild rate or the scrub rate from the relation using the value of the rebuild rate or the scrub rate as determined from the policy.


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