The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2014

Filed:

Oct. 24, 2012
Applicant:

Marklogic Corporation, San Carlos, CA (US);

Inventors:

Christopher Lindblad, Berkeley, CA (US);

Jane X. Chen, San Carlos, CA (US);

Assignee:

MarkLogic Corporation, San Carlos, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of processing a query in a distributed database implemented across a set of nodes includes receiving a query. The query is divided into split characterization queries. The split characterization queries are distributed to worker nodes. Each worker node stores a partition of the distributed database with encoded textual objects and pre-defined indices characterizing encoded textual object fragments. The split characterization queries are executed at the worker nodes to obtain preliminary information about query results. Executing the split characterization queries includes matching query fragments associated with the split characterization queries with encoded textual object fragments of the pre-defined indices to produce fragment matches representative of the size of the query results. For each split characterization query the preliminary information about query results includes a fragment count, a database partition identification, and a database host name.


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