The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 18, 2014
Filed:
Dec. 28, 2011
Applicants:
Xiaoyu Wang, Columbia, MO (US);
Ming Yang, Sunnyvale, CA (US);
Timothee Cour, San Francisco, CA (US);
Shenghuo Zhu, Santa Clara, CA (US);
Kai Yu, Santa Clara, CA (US);
Inventors:
Xiaoyu Wang, Columbia, MO (US);
Ming Yang, Sunnyvale, CA (US);
Timothee Cour, San Francisco, CA (US);
Shenghuo Zhu, Santa Clara, CA (US);
Kai Yu, Santa Clara, CA (US);
Assignee:
NEC Laboratories America, Inc., Princeton, NJ (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06F 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
Systems and methods are disclosed to search for a query image, by detecting local invariant features and local descriptors; retrieving best matching images by quantizing the local descriptors with a vocabulary tree; and reordering retrieved images with results from the vocabulary tree quantization.