The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 18, 2014
Filed:
Jul. 03, 2008
Sabine Hamlescher, Bruehl, DE;
Hartmut K. Vogler, Millbrae, CA (US);
Suresh Babu, Los Altos, CA (US);
Sabine Hamlescher, Bruehl, DE;
Hartmut K. Vogler, Millbrae, CA (US);
Suresh Babu, Los Altos, CA (US);
SAP SE, Walldorf, DE;
Abstract
A method and system for assessing data quality stored in an enterprise database is provided. In response to a request by a user, a pre-determined event, or other event, a profile is chosen from a list of profiles stored in a profile database based on the request, wherein the profile includes a set of rules for calculating data quality metrics and for triggering workflow processes. One or more data records are received from one or more enterprise databases. The data quality metrics of the one or more data records based on the set of rules for calculating data quality metrics is calculated. Based on the calculated data quality metrics and rules for triggering workflow, a determination is made regarding whether to trigger one or more workflow processes: and, if so, triggering the one or more workflow processes; and/or converting the calculated data quality metrics to a representation for display.